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RASSP Design For Testability Application Note

5.0 References

RASSP Design for Testability (DFT) Methodology document, Version 1.0, Lockheed Martin Advanced Technology Laboratories, September 1995. [METHODOLOGY_DFT95]

Evans, J. S., and R. M. Sedmak, " A Hierarchical, DFT Methodology for RASSP ", Journal of VLSI Signal Processing 15, 1997. [EVANS_96]

Evans, J. S., P. McHugh, and R. M. Sedmak, " Integration of DFT into RASSP", Proceedings 2nd Annual RASSP Conference, Arlington, Va. July 1995, pp 217-222. [EVANS_95]

Evans, J. S., S. Sharma, R. J. Tarzaiski, and R. M. Sedmak, "Tutorial on RASSP Design-For-Testability", Beta Site Tutorial Powerpoint presentation, Lockheed Martin Advanced Technology Laboratories, Camden, NJ, March 1996.

[TUT_INTRO_96] - Introduction to the problem of testing across design, manufacturing, and field deployment. Describes DFT solution, RASSP DFT goals, and the integration of DFT into RASSP.

[TUT_DFTMETH_96] - Tutorial steps for application of DFT Methodology, including test strategy diagrams (TSDs). Part of a training session for prospective users of the Methodology.

[TUT_TESTARCH_96] - Turtorial describing the RASSP overall test architecture with components testbench architecture, testability architecture, and tester architecture. The relationship of these components to the test strategy diagram is examined. The complete spectrum of testing from requirements specification to development of test plans and procedures is presented.

[TUT_METHEX_96] - Detailed application of the RASSP Methodology to the Benchmark 3 systems as part of a non-interfering shadow program. Develops TSDs, a singular test philosophy, and describes a test means evalustion. Also describes the role of dependency modeling in high level system analysis.

Tarzaiski, R. J., and S. Sharma, "Design For Test Methodology Applied Across Design and Support Cycles", RASSP Review Powerpoint presentation, Lockheed Martin Advanced Technology Laboratories, Camden, NJ, November 1996. [TARZAISKI_R96] - A complete description of the results of the LM DFT methododlogy presented at the Program Review of November, 1996. The presentation was repeatedly given during peration of a display booth where all RASSP achievements were highlighted.

Test Strategy Diagram Example (Subsystem Level), Excel 4.0 workbook, November 1996. [3dm2fe.xls] - An EXCEL implementation of the subsystem level test strategy diagram for the Benchmark 3 Functional Element consisting of one FPCTL board and two FPCAP boards. Requirements, predictions, and differences between these quantities are entered into cells for later distribution to lower level TSDs.

Test Strategy Diagram Example (Board Level), Excel 4.0 workbook, November 1996. [3dm2bds.xls] - An EXCEL implementation of the board level test strategy diagram for the benchmark 3 boards. Requirements, predictions, and differences are described. The TSD automates the interrelationships among the established sequence derived from the singular test philosophy. Test means for the boards and their capabilities of error detection, isolation, and correction are described as cell entries and summaries for higher level application of these resulat is automatically coupled to the next higher level TSD.

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