RASSP Design For Testability (DFT) Appnote
Abstract
The RASSP program has significantly benefitted with the development of the DFT Methodology and its application to the Benchmark efforts. RASSP Design For Testability ensures that hardware and software for a signal processing system is testable during all RASSP life cycle phases and that the system complies with all customer supplied requirements. DFT also generates significant economic benefits which reduce the overall life cycle cost of a product. Based upon a singular test philosophy of the DFT methodology the life cycle testability support concept .
Purpose
This note describes the role of DFT in the RASSP methodology and summarizes the life cycle singular test philosophy, procedures, and tools developed during the RASSP program. Technological and economic benefits produced by application of DFT to signal processing systems is also described and illustrated by examination of two benchmark projects.
Roadmap
1.0 Executive Summary
- 1.1 The Design For Test (DFT) Methodology - Complete Life Cycle Testability Support
- 1.2 The DFT Application Process - Tools and Design Element Reuse
- 1.3 Summary of DFT Contribution to RASSP
2.0 Introduction
3.0 Technology Description
4.0 Application Example
- 4.1 Problem Definition and Approach to Solution
- 4.2 Stepwise Application of Methodology
- 4.2.1 Dependency Modeling to Support Architecture Selection
- 4.2.2 Collection and Specification of Requirements
- 4.2.3 Requirements Consolidation and Test Strategy Selection - Singular Test Philosophy Development
- 4.2.4 Generation of TSDs and Test Architecture
- 4.2.4.1 TSD Transfer Function Values
- 4.2.4.2 TSD Test/Time Cost Attribute Values
- 4.2.4.3 TSD Implementation
- 4.2.5 Test Procedure Development
- 4.2.6 Board Level Application of DFT Design Tools
- 4.2.6.1 VHDL Component Modeling
- 4.2.6.2 Testability Analysis and Interconnection Testing
- 4.2.6.3 FPGA-Based Board Level ABIST
- 4.3 Technical Summary of Application Example
- 4.3.1 Tool Application Summary
- 4.3.2 Reuse Element Listing
- 4.3.3 Lessons Learned
- 4.4 DFT Economic Analysis
- 4.5 Application Example Conclusions/Summary
5.0 References
Approved for Public Release; Distribution Unlimited Dennis Basara