Texas Instruments has the broadest offering of IEEE 1149.1 silicon products in the industry
To facilitate the implementation of the IEEE 1149.1 boundary-scan standard in TI's ASIC products, a library of test cell components has been developed. This library contains all the test cell components required to construct a boundary-scan test structure.
CMOS Gate Arrays
BiCMOS Gate Arrays
Texas Instruments family of IEEE 1149.1 bus interface devices can provide a system with boundary-scan and built-in self-test capabilities. The family consists of 8-bit BiCMOS devices, up to 16- 18- and 20-bit Widebus devices built around TI's advanced technology providing high performance, including 3.3-volt capability.
BCT Octals
ABT Octals
ABT Widebus
ABT Widebus with Bus Hold
ABT Widebus with Bus Hold and series damping resistors
LVT (3.3-volt) Widebus
LVT (3.3-volt) Widebus with series damping resistors
Futurebus+ chipset consisting of I/O Controller, Data Path Unit, and Arbitration Bus Controller.
First RISC microprocessor with built-in instruction and data caches, integer and floating-point units, memory management, and DRAM and Sbus control.
Highly integrated microprocessor implements the SPARC Version 8 architecture.
This 32-bit floating-point DSP family is designed specifically to meet the needs of parallel processing and other real-time embedded applications.
This 16-bit fixed-point DSP family's CPU core is based upon the C25's CPU core with additional architectural enghancements to greatly improve overall performance.
MVP (Multimedia Video Processor) is a fully programmable DSP delivering two billion operations per second (BOPS) performance. MVP consists of four DSPs and a RISC processor integrated onto a single chip, comprising four million transistors.
The Test Bus Controller (TBC) provides a simple, off-the-shelf solution that can be hosted with a microprocessor to generate the signals required to control the IEEE 1149.1 test bus.
The Scan Engine software tool provides a Serial Tool Box for vector translation and portable C source code for the SN74ACT8990. With TI's Test Bus Controller and the Scan Engine software tool you get a simple, off-the-shelf solution for embedding IEEE 1149.1-based test.
Scan path partitioning can easily be supported with TI's family of scan path support devices.
The IEEE 1149.1 standard defines how to implement the standard at the device level and does not address board- or system-level issues. With TI's Addressable Shadow Port (ASP) device, multi-drop applications can now be supported on your backplane.
This special function device provides the capability to emulate the functions of logic and sugnal analyzers that can be embedded to provide non-intrusive functions monitoring of up to 16-bits in width.
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