Texas Instruments has put together a comprehensive suite of educational products for IEEE 1149.1. No matter where you are on the experience curve for IEEE 1149.1 testability -- just starting, at a midway point, or already putting testability to work in your designs -- you'll find several possibilities for moving your knowledge base forward.
Eductional Products:
Scan Educator introduces the fundamentals of the IEEE 1149.1 boundary-scan standard, including architecture, protocols and required instruction sets. Self-paced and menu-driven, it contains both information and animated boundary-scan simulations. Hands-on practice exercises guide you through a boundary-scan test of TI's IEEE 1149.1 octal at the test access port (TAP) and at the register level. You are also shown how to use IEEE 1149.1 with single or multiple devices for in-circuit observability and controllability and for interconnect testing.
Scan Educator runs on a IBM PC-AT or compatible using MS-DOS 3.3+ and requires EGA or VGA, 5 Megabytes of available hard disk space and 512 Kilobytes of available RAM.
To obtain a copy, you can download Scan Educator now.
Directions:
No matter where you are on the boundary-scan learning curve, TI's Scan Board can help you move to higher levels of understanding quickly and easily.
Scan Board can be a learning tool for new users of boundary-scan and a test and evaluation platform for the experienced user. This specially developed board comes with multiple IEEE 1149.1 devices that can help you evaluate both the tools and the concepts behind board-level testing.
With Scan Board, you can perform boundary-scan interconnect tests and insert various faults and fault types, as well as demonstrate board-level Built-In Self-Test (BIST) for testing memory, internal test (INTEST) of an ASIC, internal BIST of an ASIC, cluster testing, single- and multiple-scan paths, and many other capabilities.
Scan Board comes with schematics, netlists, X-Y plots, datasheets, test patterns, BSDL descriptions and a FREE executable software program (MS-DOS Windows only). This software allows you to apply test patterns supplied with Scan Board, or to apply your own.
Scan Board incorporates basic boundary-scan features for new users to learn boundary-scan testing, and also incorporates advanced extensions such as BIST, INTEST, internal scan and multiple scan paths for advanced users. Scan Board's physical layout separates independent multiple functions both electrically and physically while maintaining a single continuous IEEE 1149.1 scan path for ease of test manipulation. Fault injection switches are provided so the user can practice fault isolation techniques. Scan Board provides for the injection of twelve different faults. Fault types include: stuck-at-one, stuck-at-zero, bridging, non-adjacent bridging, internal device and scan path.
Scan Board is compatible with in-circuit test fixtures and testers. Nodes are accessible via boundary-scan or from the bottom with adequate and uniform spacing for in-circuit probes. Nets without both the boundary-scan driver and receiver are accessible via 40-mil probe points with 100-mil spacing.
Scan Board comes with documentation, such as board description and operation, schematics and diagrams, X-Y and Gerber plots, a fault table and boundary-scan device datasheets. Electronic files include BSDL, HSDL, Netlists (Viewlogic, EDIF 2.0.0, and Teradyne CDB), interconnect patterns (SVF), and cluster logic test patterns (SVF). Scan Board demo software (MS-DOS Winodws only) is included at no extra charge.
A quick call will get you started. Here's how to order your Texas Instruments Scan Board:
TI has combined the key elements of the IEEE 1149.1 standard on a single CD-ROM. Now the latest versions of the IEEE 1149.1-1990 specification (including IEEE 1149.1a-1993) are merged into one searchable document.
The Test Bus Evaluation (TBE) report was written by TI's Defense Systems and Electronics Group to evaluate the applications and impact of standard test buses on overall system testability. The TBE report is based on years of test bus development and applications experience at TI.
Since the early 1980s, TI has played a key role in defining test buses; first, for the VHSIC program and then later as a key contributor in both JTAG (in Europe) and IEEE 1149.1 (in the United States). TI is continuing its contribution to these efforts as a key player in defining other IEEE 1149.x test buses.
This CD-ROM brings together all the current information on the IEEE 1149.1 standard. Both Microsoft Windows and UNIX environments are supported.
A quick call will get you started. Here's how to order your Texas Instruments IEEE 1149.1 CD-ROM:
The first tape in this 74-minute, two-part video explains the growing importance of testability and the tremendous potential impact on cost, time and quality that Design-for-Testability (DFT) can bring you. It also describes the work of JTAG (Joint Test Action Group) and the provisions of the IEEE 1149.1 standard.
The second tape examines the standard in much more detail. It explains the test bus architecture and instructions and shows how you can use boundary-scan to test a board or system. You'll learn about software support standards, see example applications, and find out how TI's ASSET debugging tool can help automate boundary-scan testing. The tape clearly explains the function of each component of the standard, and shows how they work together to provide an accurate, dependable test procedure.
A quick call will get you started. Here's how to order your Texas Instruments two-part Testability Videotaptes:
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