The Test Access Port and Boundary-Scan Architecture

Colin M. Maunder and Rodham E. Tulloss (Eds), IEEE Computer Society Press, 1990

Overview

This book discusses the approaches to design-for-testability based on IEEE Standard 1149.1. The Test Access Port and Boundary-Scan Architecture explores the development of the standard, boundary-scan techniques, and solutions to the problems faced by this technology. Other topics examined include:

the structure of a typical board test program
testing and diagnosis of standardized test logic
interfacing to scan design and built-in self-test
analog and mixed-signal applications
application to system debugging and emulation

The text contains an extensive annotated bibliography, over 130 illustrations, 13 tables, and reprints of 16 important papers.

Author

COLIN MAUNDER is a consultant in computer-aided testing at BT Laboratories, UK. He is well known internationally for his courses on design-for-test and his work on IEEE Std 1149.1. He received a major IEEE Computer Society award for leading the development of this important new standard for design-for-test and is currently Emeritus Chair of the international working group that is enhancing and maintaining the standard.

RODHAM TULLOSS is a Distinguished Member of Technical Staff at AT&T Bell Laboratories, Engineering Research Center, Princeton, New Jersey. He was the first North American member of the Joint Test Action Group (JTAG) and served as chair and vice-chair of the IEEE 1149.1 Working Group. He has played a significant role in educating the engineering community about boundary-scan, for example as technical consultant to the IEEE's 1989 satellite seminar on the topic.

Publisher

The Test Access Port and Boundary-Scan Architecture is published by IEEE Computer Society Press (ISBN 0-8186-9070-4; IEEE Computer Society Press Number 2070).